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software is DataScan 3.1 (for data collection) and Jade 5.0 Plus (for data analysis) from. 238000002441 X-ray diffraction Methods 0.000 claims description 11. Application number: US11/461,830 Inventor: Matthew Peterson: Mark Oliveira. Sampled XRD patterns underwent JADE software peak analysis (Materials Data Inc).

radially integrated to obtain profiles as intensity versus 2θ using the freeware Fit2D.
